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Atomic Force Microscopes for Measuring the Invisible

Nearfield Instruments develops atomic force microscopes—devices capable of taking direct measurements of chip features just a few atoms high by sliding a probe across their surface, a process that Reuters compares to the way a needle moves across a vinyl record.

These measurements are taken periodically throughout the hundreds of steps required to manufacture a modern microchip, to ensure that the production process remains within the required tolerances—a field known as semiconductor metrology, which is currently largely dominated by the American company KLA Corporation.

A Niche Position with High Strategic Value

The company’s flagship system, called QUADRA, along with its AUDIRA platform, enables non-destructive, high-throughput, and high-resolution measurements specifically designed for the most advanced chip architectures, including High-NA EUV, gate-all-around, and 3D integration via hybrid bonding.

This cutting-edge technical specialization explains why investors are flocking to the company: amid a global boom in the manufacturing of chips dedicated to artificial intelligence, the ability to guarantee manufacturing quality at the atomic scale is becoming a strategic bottleneck for the entire semiconductor industry.

I particularly like this comparison to a turntable needle, because it brings to life a technological process that is otherwise difficult to visualize: we’re not talking about gadgets here, but about precision infrastructure that is absolutely fundamental to the entire advanced chip industry.

This content was created with the help of AI.

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